Fundamentals, instrumentation and applications of ‎characterization ‎techniques ‎commonly used to investigate ‎material structure, surface ‎topography, chemistry, ‎and phase ‎constitution: light microscopy, scanning electron ‎microscopy, ‎energy and wavelength dispersive x-ray spectroscopy, ‎x-ray ‎‎fluorescence, and x-ray diffraction. Lab experiments on ‎materials structure and composition analysis ‎using light ‎microscopy, SEM, XRD, EDS, WDS and XRF.‎

Pre-requisites: MSE201 Or ME216